By Earl J. Kirkland
Advanced Computing in Electron Microscopy, second version, brings jointly varied info on picture simulation. a useful source, this e-book presents info on numerous tools for numerical computation of excessive answer traditional and scanning transmission electron microscope photos. this article will function a useful tool for college students on the complex undergraduate or graduate point, in addition to skilled researchers within the box.
This more advantageous moment version contains:
-descriptions of latest advancements within the field
-additional fabric on aberration corrected tools and confocal electron microscopy
-expanded and enhanced examples and sections to supply more advantageous clarity
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Additional info for Advanced Computing in Electron Microscopy
It should be noted that Scherzer  stated most of the features of this image model but did not take the final step of writing it as a convolution. This section will discuss image formation in the context of the CTEM although BF-CTEM and BF-STEM are equivalent in this context due to the reciprocity theorem (see Sect. 4). The electrons incident on the specimen have a relatively high energy (approximately 100 keV to 1000 keV) as compared to the electrons in the specimen. If the specimen is very thin, then the incident electrons pass through the specimen with only small deviations in their paths and the effect of the specimen can be modeled as a simple transmission function t(x).
J. C. H. Spence, Experimental High-Resolution Electron Microscopy, Oxford University Press, 2003  17. D. B. Williams and C. B. Carter, Transmission Electron Microscopy, A Textbook for Materials Science, Plenum Press, 1996  Some Books on Electron Optics 1. P. Grivet, Electron Optics, Parts 1 and 2, 2nd english edition, Pergamon, 1972  2. P. W. Hawkes and E. Kasper, Principles of Electron Optics, Vol. 1, 2, 3, Academic Press, 1989, 1994 [151–153] 3. P. W. ), Aberration-corrected Electron Microscopy, Adv.
Are not easily visualized in a simple graph. Some of these are illustrated in image form in Figs. 13 using computational methods that will be described later. These are images of a self-luminous point which is the probe function in STEM neglecting any remaining source size coming from the tip itself. 7 Aberration Correction The most common electron lens is a rotationally symmetric lens similar to that shown in Fig. 2. The fringe field in the gap focus the electron beam. 5 Fig. 5. 8 2 Fig. 5Cs λ .
Advanced Computing in Electron Microscopy by Earl J. Kirkland